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Thu, 05 Nov 2026 04:30:00 +0000
| Type | Values Removed | Values Added |
|---|---|---|
| Title | Memory Corruption via Improper Input Validation in Exynos ENN NeuralNetworks HAL Leading to Denial of Service |
Thu, 05 Nov 2026 02:45:00 +0000
| Type | Values Removed | Values Added |
|---|---|---|
| Description | In the Samsung Exynos ENN NeuralNetworks HAL, improper input validation during request processing can cause memory corruption and lead to a denial of service condition. | |
| Weaknesses | CWE-787 | |
| References |
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Subscriptions
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Status: PUBLISHED
Assigner: samsungsemiconductor
Published:
Updated: 2026-11-05T02:40:30.369Z
Reserved: 2026-08-03T06:35:58.536Z
Link: CVE-2026-68991
No data.
Status : Received
Published: 2026-11-05T03:17:31.520
Modified: 2026-11-05T03:17:31.520
Link: CVE-2026-68991
No data.
OpenCVE Enrichment
Updated: 2026-11-05T04:15:05Z
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CWE-787
Out-of-bounds Write